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A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor

In-Hwan Ji, Min-Woo Ha, Young-Hwan Choi, Seung-Chul Lee, Chong-Man Yun, Min-Koo Han. A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor. Microelectronics Journal, 39(6):908-913, 2008. [doi]

Authors

In-Hwan Ji

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Min-Woo Ha

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Young-Hwan Choi

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Seung-Chul Lee

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Chong-Man Yun

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Min-Koo Han

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