A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor

In-Hwan Ji, Min-Woo Ha, Young-Hwan Choi, Seung-Chul Lee, Chong-Man Yun, Min-Koo Han. A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor. Microelectronics Journal, 39(6):908-913, 2008. [doi]

Abstract

Abstract is missing.