High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

In-Hwan Ji, Anoop Mathew, Jae Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour. High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]

This author has not been identified. Look up 'In-Hwan Ji' in GoogleThis author has not been identified. Look up 'Anoop Mathew' in GoogleThis author has not been identified. Look up 'Jae Hyung Park' in GoogleThis author has not been identified. Look up 'Neal Oldham' in GoogleThis author has not been identified. Look up 'Matthew McCain' in GoogleThis author has not been identified. Look up 'Shadi Sabri' in GoogleThis author has not been identified. Look up 'Edward Van Brunt' in GoogleThis author has not been identified. Look up 'Brett Hull' in GoogleThis author has not been identified. Look up 'Daniel J. Lichtenwalner' in GoogleThis author has not been identified. Look up 'Donald A. Gajewski' in GoogleThis author has not been identified. Look up 'John W. Palmour' in Google

runs on WebDSL