In-Hwan Ji, Anoop Mathew, Jae Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour. High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{JiMPOMSBHLGP23,
title = {High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes},
author = {In-Hwan Ji and Anoop Mathew and Jae Hyung Park and Neal Oldham and Matthew McCain and Shadi Sabri and Edward Van Brunt and Brett Hull and Daniel J. Lichtenwalner and Donald A. Gajewski and John W. Palmour},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118095},
url = {https://doi.org/10.1109/IRPS48203.2023.10118095},
researchr = {https://researchr.org/publication/JiMPOMSBHLGP23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}