Yi-Min Jiang, Kwang-Ting Cheng. Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices. In DAC. pages 760-765, 1999. [doi]
@inproceedings{JiangC99,
title = {Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices},
author = {Yi-Min Jiang and Kwang-Ting Cheng},
year = {1999},
doi = {10.1145/309847.310053},
url = {http://doi.acm.org/10.1145/309847.310053},
tags = {analysis},
researchr = {https://researchr.org/publication/JiangC99},
cites = {0},
citedby = {0},
pages = {760-765},
booktitle = {DAC},
}