The following publications are possibly variants of this publication:
- Modeling, testing, and analysis for delay defects and noise effects in deep submicron devicesJing-Jia Liou, Angela Krstic, Yi-Min Jiang, Kwang-Ting Cheng. tcad, 22(6):756-769, 2003. [doi]
- Vector generation for power supply noise estimation and verification of deep submicron designsYi-Min Jiang, Kwang-Ting Cheng. tvlsi, 9(2):329-340, 2001. [doi]