WiT: Optimal Wiring Topology for Electromigration Avoidance

Iris Hui-Ru Jiang, Hua-Yu Chang, Chih-Long Chang. WiT: Optimal Wiring Topology for Electromigration Avoidance. IEEE Trans. VLSI Syst., 20(4):581-592, 2012. [doi]

Abstract

Abstract is missing.