Partition Based Differential Testing for Finding Embedded Code Generation Bugs in Simulink

He Jiang 0001, Hongyi Cheng, Shikai Guo, Xiaochen Li. Partition Based Differential Testing for Finding Embedded Code Generation Bugs in Simulink. In 60th ACM/IEEE Design Automation Conference, DAC 2023, San Francisco, CA, USA, July 9-13, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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