Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger. Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1379-1388, IEEE, 2004. [doi]
@inproceedings{JiangOCG04,
title = {Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs},
author = {Hanjun Jiang and Beatriz Olleta and Degang Chen and Randall L. Geiger},
year = {2004},
doi = {10.1109/ITC.2004.183},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.183},
tags = {testing},
researchr = {https://researchr.org/publication/JiangOCG04},
cites = {0},
citedby = {0},
pages = {1379-1388},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}