Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger. Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1379-1388, IEEE, 2004. [doi]
Abstract is missing.