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EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces

Chen Jiang, Haobo Qiu, Liang Gao 0001, Dapeng Wang, Zan Yang, Liming Chen. EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces. Rel. Eng. & Sys. Safety, 198:106906, 2020. [doi]

Authors

Chen Jiang

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Haobo Qiu

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Liang Gao 0001

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Dapeng Wang

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Zan Yang

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Liming Chen

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