EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces

Chen Jiang, Haobo Qiu, Liang Gao 0001, Dapeng Wang, Zan Yang, Liming Chen. EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces. Rel. Eng. & Sys. Safety, 198:106906, 2020. [doi]

@article{JiangQGWYC20,
  title = {EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces},
  author = {Chen Jiang and Haobo Qiu and Liang Gao 0001 and Dapeng Wang and Zan Yang and Liming Chen},
  year = {2020},
  doi = {10.1016/j.ress.2020.106906},
  url = {https://doi.org/10.1016/j.ress.2020.106906},
  researchr = {https://researchr.org/publication/JiangQGWYC20},
  cites = {0},
  citedby = {0},
  journal = {Rel. Eng. & Sys. Safety},
  volume = {198},
  pages = {106906},
}