EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces

Chen Jiang, Haobo Qiu, Liang Gao 0001, Dapeng Wang, Zan Yang, Liming Chen. EEK-SYS: System reliability analysis through estimation error-guided adaptive Kriging approximation of multiple limit state surfaces. Rel. Eng. & Sys. Safety, 198:106906, 2020. [doi]

Abstract

Abstract is missing.