Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist - researchr publication authors

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Li Jiang, Qiang Xu. Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-11, IEEE, 2015. [doi]

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