Li Jiang, Qiang Xu. Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-11, IEEE, 2015. [doi]
@inproceedings{JiangX15-6,
title = {Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist},
author = {Li Jiang and Qiang Xu},
year = {2015},
doi = {10.1109/TEST.2015.7342423},
url = {http://dx.doi.org/10.1109/TEST.2015.7342423},
researchr = {https://researchr.org/publication/JiangX15-6},
cites = {0},
citedby = {0},
pages = {1-11},
booktitle = {2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6578-9},
}