Xun Jiao, Mulong Luo, Jeng-Hau Lin, Rajesh K. Gupta. An assessment of vulnerability of hardware neural networks to dynamic voltage and temperature variations. In 2017 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017, Irvine, CA, USA, November 13-16, 2017. pages 945-950, IEEE, 2017. [doi]
Abstract is missing.