Hyungmin Jin, Jindo Byun, Hyunyoon Cho, Hojun Yoon, Jin-Hee Park, Kyoungsoo Kim, Youngdon Choi, Jung Hwan Choi, Hyungjong Ko, Sang Hyun Lee. A 24Gb/s/pin PAM-4 Built Out Tester chip enabling PAM-4 chips test with NRZ interface ATE. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2021, Busan, Korea, Republic of, November 7-10, 2021. pages 1-3, IEEE, 2021. [doi]
Abstract is missing.