Le Jin, Degang Chen, Randall L. Geiger. Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]
Abstract is missing.