Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

Le Jin, Degang Chen, Randall L. Geiger. Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement, 58(8):2679-2685, 2009. [doi]

Authors

Le Jin

This author has not been identified. Look up 'Le Jin' in Google

Degang Chen

This author has not been identified. Look up 'Degang Chen' in Google

Randall L. Geiger

This author has not been identified. Look up 'Randall L. Geiger' in Google