Le Jin, Degang Chen, Randall L. Geiger. Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement, 58(8):2679-2685, 2009. [doi]
@article{JinCG09,
title = {Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal},
author = {Le Jin and Degang Chen and Randall L. Geiger},
year = {2009},
doi = {10.1109/TIM.2009.2015700},
url = {http://dx.doi.org/10.1109/TIM.2009.2015700},
tags = {testing},
researchr = {https://researchr.org/publication/JinCG09},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {58},
number = {8},
pages = {2679-2685},
}