Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

Le Jin, Degang Chen, Randall L. Geiger. Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement, 58(8):2679-2685, 2009. [doi]

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