Rui Jin, Niannian Ge, Ruifen Nie, Baohua Tian, Feng He, Xiamin Hao. Optimal design of short circuit robustness for high voltage and high power IGBTs. In 15th IEEE International Conference on ASIC, ASICON 2023, Nanjing, China, October 24-27, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.