An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli

Le Jin, Chengming He, Degang Chen, Randall L. Geiger. An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. In ISCAS (4). pages 928-931, 2004. [doi]

Abstract

Abstract is missing.