Wentian Jin, Sheriff Sadiqbatcha, Zeyu Sun, Han Zhou, Sheldon X.-D. Tan. EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects. In 38th IEEE International Conference on Computer Design, ICCD 2020, Hartford, CT, USA, October 18-21, 2020. pages 296-303, IEEE, 2020. [doi]
Abstract is missing.