An Integrated Model-Based and Data-Driven Gap Metric Method for Fault Detection and Isolation

Hailang Jin, Zhiqiang Zuo 0001, Yijing Wang, Lei Cui, Linlin Li 0005. An Integrated Model-Based and Data-Driven Gap Metric Method for Fault Detection and Isolation. IEEE T. Cybernetics, 52(12):12687-12697, 2022. [doi]

Abstract

Abstract is missing.