A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm

Ming-e Jing, Yue Hao, Dian Zhou, Xuan Zeng. A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(6):1149-1155, 2007. [doi]

Abstract

Abstract is missing.