Test Generation for an Iterative Design Flow with RTL Changes

Jerin Joe, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski. Test Generation for an Iterative Design Flow with RTL Changes. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 305-313, IEEE, 2022. [doi]

Authors

Jerin Joe

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Nilanjan Mukherjee 0001

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Irith Pomeranz

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Janusz Rajski

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