Scanning probe microscope trajectory measurement by scanning a single feature - researchr publication authors

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James C. Peyton Jones, Garrett M. Clayton. Scanning probe microscope trajectory measurement by scanning a single feature. In IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2015, Busan, South Korea, July 7-11, 2015. pages 465-469, IEEE, 2015. [doi]

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