James C. Peyton Jones, Garrett M. Clayton. Scanning probe microscope trajectory measurement by scanning a single feature. In IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2015, Busan, South Korea, July 7-11, 2015. pages 465-469, IEEE, 2015. [doi]
@inproceedings{JonesC15-2,
title = {Scanning probe microscope trajectory measurement by scanning a single feature},
author = {James C. Peyton Jones and Garrett M. Clayton},
year = {2015},
doi = {10.1109/AIM.2015.7222577},
url = {https://doi.org/10.1109/AIM.2015.7222577},
researchr = {https://researchr.org/publication/JonesC15-2},
cites = {0},
citedby = {0},
pages = {465-469},
booktitle = {IEEE International Conference on Advanced Intelligent Mechatronics, AIM 2015, Busan, South Korea, July 7-11, 2015},
publisher = {IEEE},
isbn = {978-1-4673-9107-8},
}