Alex K. Jones, Stephen Longofono, Sébastien Ollivier, Donald Kline Jr., Jiangwei Zhang, Rami G. Melhem. Tuning Memory Fault Tolerance on the Edge. In Yiran Chen, Victor V. Zhirnov, Avesta Sasan, Ioannis Savidis, editors, GLSVLSI '21: Great Lakes Symposium on VLSI 2021, Virtual Event, USA, June 22-25, 2021. pages 421-424, ACM, 2021. [doi]
@inproceedings{JonesLOKZM21,
title = {Tuning Memory Fault Tolerance on the Edge},
author = {Alex K. Jones and Stephen Longofono and Sébastien Ollivier and Donald Kline Jr. and Jiangwei Zhang and Rami G. Melhem},
year = {2021},
doi = {10.1145/3453688.3462231},
url = {https://doi.org/10.1145/3453688.3462231},
researchr = {https://researchr.org/publication/JonesLOKZM21},
cites = {0},
citedby = {0},
pages = {421-424},
booktitle = {GLSVLSI '21: Great Lakes Symposium on VLSI 2021, Virtual Event, USA, June 22-25, 2021},
editor = {Yiran Chen and Victor V. Zhirnov and Avesta Sasan and Ioannis Savidis},
publisher = {ACM},
isbn = {978-1-4503-8393-6},
}