F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers. Testing and programming flash memories on assemblies during high volume production. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 470-479, IEEE Computer Society, 2001.
Abstract is missing.