Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala. How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectronics Journal, 34(12):1195-1201, 2003. [doi]
Abstract is missing.