Study of dynamic TDDB in scaled FinFET technologies

K. Joshi, S. W. Chang, D.-S. Huang, P. J. Liao, Y. H. Lee. Study of dynamic TDDB in scaled FinFET technologies. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 5-1, IEEE, 2018. [doi]

Abstract

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