Reduction of Instantaneous Power by Ripple Scan Clocking

Kirti Joshi, Eric MacDonald. Reduction of Instantaneous Power by Ripple Scan Clocking. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 271-276, IEEE Computer Society, 2005. [doi]

Abstract

Abstract is missing.