Design considerations for reliable OxRAM-based non-volatile flip-flops in 28nm FD-SOI technology

Nenad Jovanovic, Olivier Thomas, Elisa Vianello, Bosko Nikolic, L. Naviner. Design considerations for reliable OxRAM-based non-volatile flip-flops in 28nm FD-SOI technology. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 1146-1149, IEEE, 2016. [doi]

Abstract

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