Inertial and degradation delay model for CMOS logic gates

Jorge Juan-Chico, Paulino Ruiz-de-Clavijo, Manuel J. Bellido, Antonio J. Acosta, M. Valenia. Inertial and degradation delay model for CMOS logic gates. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 459-462, IEEE, 2000. [doi]

Abstract

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