Removing JTAG Bottlenecks in System Interconnect Test

Hong Shin Jun, Sung Soo Chung, Sang H. Baeg. Removing JTAG Bottlenecks in System Interconnect Test. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 173-180, IEEE, 2004. [doi]

Authors

Hong Shin Jun

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Sung Soo Chung

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Sang H. Baeg

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