Efficient diagnosis technique for aging defects on automotive semiconductor chips - researchr publication authors

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Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park. Efficient diagnosis technique for aging defects on automotive semiconductor chips. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]

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