Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park. Efficient diagnosis technique for aging defects on automotive semiconductor chips. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]
Abstract is missing.