Reliable High-Quality Metal-Embedded h-BN Contacts to p-type WSe2 - researchr publication authors

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Younghun Jung, Min Sup Choi, Abhinandan Borah, Ankur Nipane, Won Jong Yoo, James Hanel, James T. Teherani. Reliable High-Quality Metal-Embedded h-BN Contacts to p-type WSe2. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]

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