Younghun Jung, Min Sup Choi, Abhinandan Borah, Ankur Nipane, Won Jong Yoo, James Hanel, James T. Teherani. Reliable High-Quality Metal-Embedded h-BN Contacts to p-type WSe2. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]
@inproceedings{JungCBNYHT18,
title = {Reliable High-Quality Metal-Embedded h-BN Contacts to p-type WSe2},
author = {Younghun Jung and Min Sup Choi and Abhinandan Borah and Ankur Nipane and Won Jong Yoo and James Hanel and James T. Teherani},
year = {2018},
doi = {10.1109/DRC.2018.8442181},
url = {https://doi.org/10.1109/DRC.2018.8442181},
researchr = {https://researchr.org/publication/JungCBNYHT18},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-3028-0},
}