Analysis of Flat-Band-Voltage Dependent Breakdown Voltage for 10 nm Double Gate MOSFET

Hak-Kee Jung, Sima Dimitrijev. Analysis of Flat-Band-Voltage Dependent Breakdown Voltage for 10 nm Double Gate MOSFET. J. Inform. and Commun. Convergence Engineering, 16(1), 2018. [doi]

Authors

Hak-Kee Jung

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Sima Dimitrijev

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