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Hak-Kee Jung, Sima Dimitrijev. Analysis of Flat-Band-Voltage Dependent Breakdown Voltage for 10 nm Double Gate MOSFET. J. Inform. and Commun. Convergence Engineering, 16(1), 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping DistributionHak-Kee Jung. jicce, 10(2):200-204, 2012. [doi]
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