Transistor sizing for reliable domino logic design in dual threshold voltage technologies

Seong-Ook Jung, Ki-Wook Kim, Sung-Mo Kang. Transistor sizing for reliable domino logic design in dual threshold voltage technologies. In Kaushik Roy, Sung-Mo Kang, Cheng-Kok Koh, editors, Proceedings of the 11th ACM Great Lakes Symposium on VLSI 2001, West Lafayette, Indiana, USA, 2001. pages 133-138, ACM, 2001. [doi]

Abstract

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