In-Seok Jung, Yong-Bin Kim, Fabrizio Lombardi. A novel sort error hardened 10T SRAM cells for low voltage operation. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 714-717, IEEE, 2012. [doi]
Abstract is missing.