Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks

S.-Y. Jung, Y. H. Tsai, W. Y. Chiu, J. S. Hu, C. T. Sun. Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks. In 2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018, Auckland, New Zealand, July 9-12, 2018. pages 1456-1461, IEEE, 2018. [doi]

Abstract

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