Reducing Logic Locking Key Leakage through the Scan Chain

Kyle Juretus, Ioannis Savidis. Reducing Logic Locking Key Leakage through the Scan Chain. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]

Authors

Kyle Juretus

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Ioannis Savidis

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