Kyle Juretus, Ioannis Savidis. Reducing Logic Locking Key Leakage through the Scan Chain. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{JuretusS20-0, title = {Reducing Logic Locking Key Leakage through the Scan Chain}, author = {Kyle Juretus and Ioannis Savidis}, year = {2020}, doi = {10.1109/ISCAS45731.2020.9180707}, url = {https://doi.org/10.1109/ISCAS45731.2020.9180707}, researchr = {https://researchr.org/publication/JuretusS20-0}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020}, publisher = {IEEE}, isbn = {978-1-7281-3320-1}, }