Parisa Kabiri, Zainalabedin Navabi. Effective RT-level software-based self-testing of embedded processor cores. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 209-212, IEEE, 2012. [doi]
Abstract is missing.