Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Artur Pogiel, Janusz Rajski, Lukasz Rybak 0001, Jerzy Tyszer. LBIST for Automotive ICs With Enhanced Test Generation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):2290-2300, 2022. [doi]
@article{KaczmarekM0PR0T22,
title = {LBIST for Automotive ICs With Enhanced Test Generation},
author = {Bartosz Kaczmarek and Grzegorz Mrugalski and Nilanjan Mukherjee 0001 and Artur Pogiel and Janusz Rajski and Lukasz Rybak 0001 and Jerzy Tyszer},
year = {2022},
doi = {10.1109/TCAD.2021.3100741},
url = {https://doi.org/10.1109/TCAD.2021.3100741},
researchr = {https://researchr.org/publication/KaczmarekM0PR0T22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {7},
pages = {2290-2300},
}